英文标准名称：Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method
英文标准名称：Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method
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2019-11-30
GB/T 26068-2018,硅片和硅锭载流子复合寿命的测试,非接触微波反射光电导衰减法
